Tiêu chuẩn quốc tế

• Số hiệu / Standard Number: ASTM E1078-14
• Năm ban hành / Publication date: 2014
• Tình trạng / Status: W - Hết hiệu lực
• Tên tiếng Anh / Title in English: Standard Guide for Specimen Preparation and Mounting in Surface Analysis
• Chỉ số phân loại Quốc tế (ICS) / By field: 71.040.50 - Phương pháp vật lý hoá học của phân tích
• Số trang / Page: 10

Phạm vi áp dụng / Scope of standard

1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS and ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.