Tiêu chuẩn quốc tế
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Số hiệu
Standard Number
ASTM E2246-11(2018)
Năm ban hành 2018
Publication date
Tình trạng
A - Còn hiệu lực
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Tên tiếng Anh
Title in English Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
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Chỉ số phân loại Quốc tế (ICS)
By field |
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Số trang
Page 21
Giá:
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Phạm vi áp dụng
Scope of standard 1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope. Measurements from cantilevers that are touching the underlying layer are not accepted. 1.2 This test method uses a non-contact optical interferometric microscope with the capability of obtaining topographical 3-D data sets. It is performed in the laboratory. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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