Tiêu chuẩn quốc tế

• Số hiệu / Standard Number: ASTM F1263-11(2019)
• Năm ban hành / Publication date: 2019
• Tình trạng / Status: A - Còn hiệu lực
• Tên tiếng Anh / Title in English: Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
• Chỉ số phân loại Quốc tế (ICS) / By field: 31.020 - Thành phần điện tử nói chung
• Số trang / Page: 3
• Phạm vi áp dụng / Scope of standard: 1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution. 1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.