Tiêu chuẩn quốc tế
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Số hiệu
Standard Number
ASTM F1893-98(2003)
Năm ban hành 2003
Publication date
Tình trạng
W - Hết hiệu lực
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Tên tiếng Anh
Title in English Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
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Chỉ số phân loại Quốc tế (ICS)
By field |
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Số trang
Page 5
Giá:
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Phạm vi áp dụng
Scope of standard 1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test. 1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
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