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Tìm thấy 73948 kết quả.

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20241

IEC 60695-11-5:2016

Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance

20242

IEC 60695-11-5:2016 RLV

Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance

20243

IEC 60695-8-1:2016

Fire hazard testing - Part 8-1: Heat release - General guidance

20244

IEC 60695-8-2:2016

Fire hazard testing - Part 8-2: Heat release - Summary and relevance of test methods

20245

IEC 60700-2:2016

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 2: Terminology

20246

IEC 60702-3:2016

Mineral insulated cables and their terminations with a rated voltage not exceeding 750 V - Part 3: Guide for use

20247

IEC 60704-2-13:2016

Household and similar electrical appliances - Test code for the determination of airborne acoustical noise - Part 2-13: Particular requirements for range hoods and other cooking fume extractors

20248

IEC 60728-101:2016

Cable networks for television signals, sound signals and interactive services - Part 101: System performance of forward paths loaded with digital channels only

20249

IEC 60728-11:2016

Cable networks for television signals, sound signals and interactive services - Part 11: Safety

20250

IEC 60731:2011/AMD1:2016

Amendment 1 - Medical electrical equipment - Dosimeters with ionization chambers as used in radiotherapy

20251

IEC 60731:2011+AMD1:2016 CSV

Medical electrical equipment - Dosimeters with ionization chambersas used in radiotherapy

20252

IEC 60747-2:2016

Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

20253

IEC 60747-5-6:2016

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

20254

IEC 60747-5-7:2016

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

20255

IEC 60747-6:2016

Semiconductor devices - Part 6: Discrete devices - Thyristors

20256

IEC 60749-44:2016

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

20257

IEC 60758:2016

Synthetic quartz crystal - Specifications and guidelines for use

20258

IEC 60794-2-22:2016

Optical fibre cables - Part 2-22: Indoor cables - Detail specification for multi-simplex breakout optical cables to be terminated with connectors

20259

IEC 60794-3-20:2016

Optical fibre cables - Part 3-20: Outdoor cables - Family specification for self-supporting aerial telecommunication cables

20260

IEC 60794-3-70:2016

Optical fibre cables - Part 3-70: Outdoor cables - Family specification for outdoor optical fibre cables for rapid/multiple deployment

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