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| 26001 |
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| 26002 |
IEC 60684-3-205:2011
Flexible insulating sleeving - Part 3: Specifications for individual types of sleeving - Sheet 205: Heat-shrinkable chlorinated polyolefin sleeving, flame retarded, nominal shrink ratio 1,7:1 and 2:1 |
| 26003 |
IEC 60684-3-247:2011
Flexible insulating sleeving - Part 3: Specifications for individual types of sleeving - Sheet 247: Heat-shrinkable, polyolefin sleeving, dual wall, not flame retarded, thick and medium wall |
| 26004 |
IEC 60684-3-271:2011
Flexible insulating sleeving - Part 3: Specifications for individual types of sleeving - Sheet 271: Heat-shrinkable elastomer sleevings, flame retarded, fluid resistant, shrink ratio 2:1 |
| 26005 |
IEC 60695-11-4:2011
Fire hazard testing - Part 11-4: Test flames - 50 W flame - Apparatus and confirmational test method |
| 26006 |
IEC 60695-7-2:2011
Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods |
| 26007 |
IEC 60695-7-3:2011
Fire hazard testing - Part 7-3: Toxicity of fire effluent - Use and interpretation of test results |
| 26008 |
IEC 60704-2-10:2011
Household and similar electrical appliances - Test code for the determination of airborne acoustical noise - Part 2-10: Particular requirements for electric cooking ranges, ovens, grills, microwave ovens and any combination of these |
| 26009 |
IEC 60704-2-4:2011
Household and similar electrical appliances - Test code for the determination of airborne acoustical noise - Part 2-4: Particular requirements for washing machines and spin extractors |
| 26010 |
IEC 60728-6:2011
Cable networks for television signals, sound signals and interactive services - Part 6: Optical equipment |
| 26011 |
IEC 60731:2011
Medical electrical equipment - Dosimeters with ionization chambers as used in radiotherapy |
| 26012 |
IEC 60745-2-22:2011
Hand-held motor-operated electric tools - Safety - Part 2-22: Particular requirements for cut-off machines |
| 26013 |
IEC 60747-14-4:2011
Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers |
| 26014 |
IEC 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability |
| 26015 |
IEC 60749-23:2004/AMD1:2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life |
| 26016 |
IEC 60749-23:2004+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life |
| 26017 |
IEC 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test |
| 26018 |
IEC 60749-30:2005/AMD1:2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing |
| 26019 |
IEC 60749-30:2005+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing |
| 26020 |
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge |
