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Tìm thấy 73948 kết quả.

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27021

IEC 60745-2-17:2010

Hand-held motor-operated electric tools - Safety - Part 2-17: Particular requirements for routers and trimmers

27022

IEC 60745-2-19:2005/AMD1:2010

Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-19: Particular requirements for jointers

27023

IEC 60745-2-19:2005+AMD1:2010 CSV

Hand-held motor-operated electric tools - Safety - Part 2-19: Particular requirements for jointers

27024

IEC 60745-2-3:2006/AMD1:2010

Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-3: Particular requirements for grinders, polishers and disk-type sanders

27025

IEC 60745-2-3:2006+AMD1:2010 CSV

Hand-held motor-operated electric tools - Safety - Part 2-3: Particular requirements for grinders, polishers and disk-type sanders

27026

IEC 60745-2-5:2010

Hand-held motor-operated electric tools - Safety - Part 2-5: Particular requirements for circular saws

27027

IEC 60747-1:2006/AMD1:2010

Amendment 1 - Semiconductor devices - Part 1: General

27028
27029

IEC 60747-14-1:2010

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

27030

IEC 60747-14-5:2010

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

27031

IEC 60747-15:2010

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

27032

IEC 60747-7:2010

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

27033

IEC 60747-8:2010

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

27034

IEC 60749-15:2010

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

27035

IEC 60749-19:2003/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

27036

IEC 60749-19:2003+AMD1:2010 CSV

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

27037

IEC 60749-32:2002/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

27038

IEC 60749-32:2002+AMD1:2010 CSV

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

27039

IEC 60749-34:2010

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

27040

IEC 60763-1:2010

Laminated pressboard for electrical purposes - Part 1: Definitions, classification and general requirements

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