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Tìm thấy 73948 kết quả.

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27161

IEC 62305-2:2010

Protection against lightning - Part 2: Risk management

27162

IEC 62305-3:2010

Protection against lightning - Part 3: Physical damage to structures and life hazard

27163

IEC 62305-4:2010

Protection against lightning - Part 4: Electrical and electronic systems within structures

27164

IEC 62317-2:2010

Ferrite cores - Dimensions - Part 2: Pot-cores for use in telecommunications, power supply, and filter applications

27165

IEC 62329-3-100:2010

Heat-shrinkable moulded shapes - Part 3: Specification requirements for shape dimensions, material requirements and compatibility performance - Sheet 100: Heat-shrinkable moulded shape dimensions

27166

IEC 62329-3-101:2010

Heat-shrinkable moulded shapes - Part 3: Specification requirements for shape dimensions, material requirements and compatibility performance - Sheet 101: Heat-shrinkable moulded shapes, polyolefin, semi-rigid, limited fire hazard, material requirements and system performance

27167

IEC 62329-3-102:2010

Heat-shrinkable moulded shapes - Part 3: Specification requirements for shape dimensions, material requirements and compatibility performance - Sheet 102: Heat-shrinkable elastomeric moulded shapes, semi-rigid, material requirements and system performance

27168

IEC 62333-3:2010

Noise suppression sheet for digital devices and equipment - Part 3: Characterization of parameters of noise suppression sheet

27169

IEC 62359:2010

Ultrasonics - Field characterization - Test methods for the determination of thermal and mechanical indices related to medical diagnostic ultrasonic fields

27170

IEC 62374-1:2010

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

27171

IEC 62415:2010

Semiconductor devices - Constant current electromigration test

27172

IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

27173

IEC 62417:2010

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

27174

IEC 62418:2010

Semiconductor devices - Metallization stress void test

27175

IEC 62438:2010

Radiation protection instrumentation - Mobile instrumentation for the measurement of photon and neutron radiation in the environment

27176

IEC 62439-1:2010

Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods

27177

IEC 62439-4:2010

Industrial communication networks - High availability automation networks - Part 4: Cross-network Redundancy Protocol (CRP)

27178

IEC 62439-6:2010

Industrial communication networks - High availability automation networks - Part 6: Distributed Redundancy Protocol (DRP)

27179

IEC 62443-2-1:2010

Industrial communication networks - Network and system security - Part 2-1: Establishing an industrial automation and control system security program

27180

IEC 62444:2010

Cable glands for electrical installations

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