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Tìm thấy 73948 kết quả.

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29181

IEC 60745-2-21:2002+AMD1:2008 CSV

Hand-held motor-operated electric tools - Safety - Part 2-21: Particular requirements for drain cleaners

29182

IEC 60745-2-4:2002/AMD1:2008

Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-4: Particular requirements for sanders and polishers other than disk type

29183

IEC 60745-2-4:2002+AMD1:2008 CSV

Hand-held motor-operated electric tools - Safety - Part 2-4: Particular requirements for sanders and polishers other than disk type

29184

IEC 60745-2-6:2003/AMD2:2008

Amendment 2 - Hand-held motor-operated electric tools - Safety - Part 2-6: Particular requirements for hammers

29185

IEC 60745-2-6:2003+AMD1:2006+AMD2:2008 CSV

Hand-held motor-operated electric tools - Safety - Part 2-6: Particular requirements for hammers

29186

IEC 60745-2-8:2003/AMD1:2008

Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-8: Particular requirements for shears and nibblers

29187

IEC 60745-2-8:2003+AMD1:2008 CSV

Hand-held motor-operated electric tools - Safety - Part 2-8: Particular requirements for shears and nibblers

29188

IEC 60745-2-9:2003/AMD1:2008

Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-9: Particular requirements for tappers

29189

IEC 60745-2-9:2003+AMD1:2008 CSV

Hand-held motor-operated electric tools - Safety - Part 2-9: Particular requirements for tappers

29190

IEC 60748-2-20:2008

Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

29191

IEC 60749-20:2008

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

29192

IEC 60749-37:2008

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

29193

IEC 60749-38:2008

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

29194

IEC 60751:2008

Industrial platinum resistance thermometers and platinum temperature sensors

29195

IEC 60793-2-60:2008

Optical fibres - Part 2-60: Product specifications - Sectional specification for category C single-mode intraconnection fibres

29196

IEC 60794-2-40:2008

Optical fibre cables - Part 2-40: Indoor optical fibre cables - Family specification for A4 fibre cables

29197

IEC 60794-2-41:2008

Optical fibre cables - Part 2-41: Indoor cables - Product specification for simplex and duplex buffered A4 fibres

29198

IEC 60794-2-42:2008

Optical fibre cables - Part 2-42: Indoor optical fibre cables - Product specification for simplex and duplex cables with A4 fibres

29199

IEC 60794-2-50:2008

Optical fibre cables - Part 2-50: Indoor cables - Family specification for simplex and duplex cables for use in terminated cable assemblies

29200

IEC 60794-3-30:2008

Optical fibre cables - Part 3-30: Outdoor cables - Family specification for optical telecommunication cables for lakes, river crossings and coastal application

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