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5081 |
EN ISO 11611:2015Protective clothing for use in welding and allied processes (ISO 11611:2015) Protective clothing for use in welding and allied processes (ISO 11611:2015) |
5082 |
EN ISO 11612:2015Protective clothing Clothing to protect against heat and flame Minimum performance requirements (ISO 11612:2015) Protective clothing Clothing to protect against heat and flame Minimum performance requirements (ISO 11612:2015) |
5083 |
EN ISO 14116:2015Protective clothing Protection against flame Limited flame spread materials, material assemblies and clothing (ISO 14116:2015) Protective clothing Protection against flame Limited flame spread materials, material assemblies and clothing (ISO 14116:2015) |
5084 |
EN ISO 16089:2015Machine tools - Safety - Stationary grinding machines (ISO 16089:2015) Machine tools - Safety - Stationary grinding machines (ISO 16089:2015) |
5085 |
EN ISO 16230-1:2015Agricultural machinery and tractors - Safety of higher voltage electrical and electronic components and systems - Part 1: General requirements (ISO 16230-1:2015) Agricultural machinery and tractors - Safety of higher voltage electrical and electronic components and systems - Part 1: General requirements (ISO 16230-1:2015) |
5086 |
EN ISO 16231-2:2015Self-propelled agricultural machinery - Assessment of stability - Part 2: Determination of static stability and test procedures (ISO 16231-2:2015) Self-propelled agricultural machinery - Assessment of stability - Part 2: Determination of static stability and test procedures (ISO 16231-2:2015) |
5087 |
IEC 60050-161:1990/AMD5:2015
Amendment 5 - International Electrotechnical Vocabulary (IEV) - Part 161: Electromagnetic compatibility |
5088 |
IEC 61000-4-16:2015
Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz |
5089 |
IEC 61000-4-16:2015 RLV
Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz |
5090 |
IEC 61076-4-116:2012/AMD1:2015
Amendment 1 - Connectors for electronic equipment - Product requirements - Part 4-116: Printed board connectors - Detail specification for a high-speed two-part connector with integrated shielding function |
5091 |
IEC 61076-4-116:2012+AMD1:2015 CSV
Connectors for electronic equipment - Product requirements - Part4-116: Printed board connectors - Detail specification for a high-speed two-part connector with integrated shielding function |
5092 |
IEC 61169-47:2015
Radio-frequency connectors - Part 47: Sectional specification for radio-frequency coaxial connectors with clamp coupling, typically for use in 75 Ω cable networks (type F-Quick) |
5093 |
IEC 61169-51:2015
Radio-frequency connectors - Part 51: Sectional specification for RF coaxial connectors with inner diameter of outer conductors 13,5 mm with bayonet lock - Characteristic impedance 50 Ω (type QLI) |
5094 |
IEC 61169-52:2015
Radio-frequency connectors - Part 52: Sectional specification for series MMCX RF coaxial connectors |
5095 |
IEC 61169-53:2015
Radio-frequency connectors - Part 53: Sectional specification for RF coaxial connectors with inner diameter of outer conductor 16 mm with screw lock - Characteristic impedance 50 Ω (Type S7-16) |
5096 |
IEC 61196-1-116:2015
Coaxial communication cables - Part 1-116: Electrical test methods - Test for impedance with time domain reflectometry (TDR) |
5097 |
IEC 61643-22:2015
Low-voltage surge protective devices - Part 22: Surge protective devices connected to telecommunications and signalling networks - Selection and application principles |
5098 |
IEC 61669:2015
Electroacoustics - Measurement of real-ear acoustical performance characteristics of hearing aids |
5099 |
IEC 61675-2:2015
Radionuclide imaging devices - Characteristics and test conditions - Part 2: Gamma cameras for planar, wholebody, and SPECT imaging |
5100 |
IEC 62047-16:2015
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods |