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| 53281 |
DIN EN 60749-40Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011 |
| 53282 |
DIN EN 60749-41Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016) Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016) |
| 53283 |
DIN EN 60749-42Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014 |
| 53284 |
DIN EN 60749-43Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017 |
| 53285 |
DIN EN 60749-44Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016 |
| 53286 |
DIN EN 60749-5Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017 |
| 53287 |
DIN EN 60749-6Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 |
| 53288 |
DIN EN 60749-7Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011 |
| 53289 |
DIN EN 60749-8Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003 |
| 53290 |
DIN EN 60749-9Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017 |
| 53291 |
DIN EN 6075Aerospace series - Static seal elements O-Ring ethylene-propylene, moulded, phosphate ester resistant (- 55 °C to 107 °C) - Inch series; German and English version EN 6075:2017 Aerospace series - Static seal elements O-Ring ethylene-propylene, moulded, phosphate ester resistant (- 55 °C to 107 °C) - Inch series; German and English version EN 6075:2017 |
| 53292 |
DIN EN 60751Industrial platinum resistance thermometers and platinum temperature sensors (IEC 60751:2008); German version EN 60751:2008 Industrial platinum resistance thermometers and platinum temperature sensors (IEC 60751:2008); German version EN 60751:2008 |
| 53293 |
DIN EN 60754-1*VDE 0482-754-1Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content (IEC 60754-1:2011 + Corrigendum Nov. 2013); German version EN 60754-1:2014 Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content (IEC 60754-1:2011 + Corrigendum Nov. 2013); German version EN 60754-1:2014 |
| 53294 |
DIN EN 60754-1/A1*VDE 0482-754-1/A1Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content (IEC 20/1824/CD:2018) Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content (IEC 20/1824/CD:2018) |
| 53295 |
DIN EN 60754-2*VDE 0482-754-2Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity (IEC 60754-2:2011); German version EN 60754-2:2014 Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity (IEC 60754-2:2011); German version EN 60754-2:2014 |
| 53296 |
DIN EN 60754-2/A1*VDE 0482-754-2/A1Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity (IEC 20/1825/CD:2018); Text in German and English Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity (IEC 20/1825/CD:2018); Text in German and English |
| 53297 |
DIN EN 60754-3*VDE 0482-754-3Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography |
| 53298 |
DIN EN 60756Non-broadcast video recorders; time base stability (IEC 60756:1991); German version EN 60756:1993 Non-broadcast video recorders; time base stability (IEC 60756:1991); German version EN 60756:1993 |
| 53299 |
DIN EN 60758Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016 |
| 53300 |
DIN EN 6076Aerospace series - Static seal elements O-Ring for straight thread tube fitting boss, ethylene-propylene, moulded, phosphate ester resistant (-55 °C to 107 °C) - Inch series; German and English version EN 6076:2017 Aerospace series - Static seal elements O-Ring for straight thread tube fitting boss, ethylene-propylene, moulded, phosphate ester resistant (-55 °C to 107 °C) - Inch series; German and English version EN 6076:2017 |
