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521 |
BS QC 300201:1985*IEC 60384-15-3:1984*QC 300201Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
522 |
BS QC 300202:1985*IEC 60384-15-2:1984*QC 300202Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
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BS QC 221300:1997*IEC 60169-10:1983Radio-frequency connectors. RF coaxial connectors with inner diameter of outer conductor 3 mm (0,12 in) with snap-on coupling. Characteristic impedance 50 ohms (Type SMB) Radio-frequency connectors. RF coaxial connectors with inner diameter of outer conductor 3 mm (0,12 in) with snap-on coupling. Characteristic impedance 50 ohms (Type SMB) |
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BS 9940-03.0:1983*IEC 60115-5:1982*QC 400300:1982Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed precision resistors Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed precision resistors |
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BS CECC 25300:1981Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications |
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BS CECC 40300:1981Harmonized system of quality assessment for electronic components: sectional specification: fixed precision resistors Harmonized system of quality assessment for electronic components: sectional specification: fixed precision resistors |
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BS EN 113000:1993*CECC 13000:1980Harmonized system of quality assessment for electronic components. Generic specification: camera tubes Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
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BS 4323:1979*ISO 3005-1978Method for determination of dimensional change of fabrics induced by free steam Method for determination of dimensional change of fabrics induced by free steam |
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BS CECC 41300:1979Harmonized system of quality assessment for electronic components. Sectional specification: low power single-turn rotary potentiometers Harmonized system of quality assessment for electronic components. Sectional specification: low power single-turn rotary potentiometers |
531 |
DIN 8300:1971Movements for recording instruments; requirements, marking, designation Movements for recording instruments; requirements, marking, designation |
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DIN 73005:1970Operating parts, light-, signal- and control-instruments for motor cycles Operating parts, light-, signal- and control-instruments for motor cycles |
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ASTM C 1300Standard Test Method for Linear Thermal Expansion of Glaze Frits and Ceramic Whiteware Materials by the Interferometric Method Standard Test Method for Linear Thermal Expansion of Glaze Frits and Ceramic Whiteware Materials by the Interferometric Method |
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ASTM D 2300Standard Test Method for Gassing of Electrical Insulating Liquids Under Electrical Stress and Ionization (Modified Pirelli Method) Standard Test Method for Gassing of Electrical Insulating Liquids Under Electrical Stress and Ionization (Modified Pirelli Method) |
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ASTM D 3003Standard Test Method for Pressure Mottling and Blocking Resistance of Organic Coatings on Metal Substrates Standard Test Method for Pressure Mottling and Blocking Resistance of Organic Coatings on Metal Substrates |
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ASTM D 3004Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials |
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ASTM D 3005Standard Specification for Low-Temperature Resistant Vinyl Chloride Plastic Pressure-Sensitive Electrical Insulating Tape Standard Specification for Low-Temperature Resistant Vinyl Chloride Plastic Pressure-Sensitive Electrical Insulating Tape |
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ASTM D 3006Standard Specification for Polyethylene Plastic Pressure-Sensitive Electrical Insulating Tape Standard Specification for Polyethylene Plastic Pressure-Sensitive Electrical Insulating Tape |
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ASTM D 3300Standard Test Method for Dielectric Breakdown Voltage of Insulating Oils of Petroleum Origin Under Impulse Conditions Standard Test Method for Dielectric Breakdown Voltage of Insulating Oils of Petroleum Origin Under Impulse Conditions |
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ASTM D 4300Standard Test Methods for Ability of Adhesive Films to Support or Resist the Growth of Fungi Standard Test Methods for Ability of Adhesive Films to Support or Resist the Growth of Fungi |