Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 73948 kết quả.
Searching result
| 55541 |
DIN EN 62047-19Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013 |
| 55542 |
DIN EN 62047-2Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006 |
| 55543 |
DIN EN 62047-20Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014 |
| 55544 |
DIN EN 62047-21Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014 Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014 |
| 55545 |
DIN EN 62047-22Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014 |
| 55546 |
DIN EN 62047-25Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016 |
| 55547 |
DIN EN 62047-26Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016 Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016 |
| 55548 |
DIN EN 62047-3Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006 |
| 55549 |
DIN EN 62047-4Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010 |
| 55550 |
DIN EN 62047-5Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011); German version EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011); German version EN 62047-5:2011 |
| 55551 |
DIN EN 62047-6Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010 |
| 55552 |
DIN EN 62047-7Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011 |
| 55553 |
DIN EN 62047-8Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011 |
| 55554 |
DIN EN 62047-9Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011 |
| 55555 |
DIN EN 62052-11*VDE 0418-2-11Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 11: Metering equipment (IEC 62052-11:2003 + A1:2016); German version EN 62052-11:2003 + A1:2017 Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 11: Metering equipment (IEC 62052-11:2003 + A1:2016); German version EN 62052-11:2003 + A1:2017 |
| 55556 |
DIN EN 62052-21*VDE 0418-2-21Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 21: Tariff and load control equipment (IEC 62052-21:2004 + A1:2016); German version EN 62052-21:2004 + A1:2017 Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 21: Tariff and load control equipment (IEC 62052-21:2004 + A1:2016); German version EN 62052-21:2004 + A1:2017 |
| 55557 |
DIN EN 62052-31*VDE 0418-2-31Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 31: Product safety requirements and tests (IEC 62052-31:2015); German version EN 62052-31:2016 Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 31: Product safety requirements and tests (IEC 62052-31:2015); German version EN 62052-31:2016 |
| 55558 |
DIN EN 62053-11*VDE 0418-3-11Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2) (IEC 62053-11:2003 + A1:2016); German version EN 62053-11:2003 + A1:2017 Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2) (IEC 62053-11:2003 + A1:2016); German version EN 62053-11:2003 + A1:2017 |
| 55559 |
DIN EN 62053-21*VDE 0418-3-21Electricity metering equipment (a.c.) - Particular requirements - Part 21: Static meters for active energy (classes 1 and 2) (IEC 62053-21:2003 + A1:2016); German version EN 62053-21:2003 + A1:2017 Electricity metering equipment (a.c.) - Particular requirements - Part 21: Static meters for active energy (classes 1 and 2) (IEC 62053-21:2003 + A1:2016); German version EN 62053-21:2003 + A1:2017 |
| 55560 |
DIN EN 62053-22*VDE 0418-3-22Electricity metering equipment (a.c.) - Particular requirements - Part 22: Static meters for active energy (classes 0,2 S and 0,5 S) (IEC 62053-22:2003 + A1:2016); German version EN 62053-22:2003 + A1:2017 Electricity metering equipment (a.c.) - Particular requirements - Part 22: Static meters for active energy (classes 0,2 S and 0,5 S) (IEC 62053-22:2003 + A1:2016); German version EN 62053-22:2003 + A1:2017 |
