Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 73948 kết quả.
Searching result
64261 |
DIN IEC/TS 62607-4-1*DIN SPEC 42607-4-1Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) |
64262 |
DIN IEC/TS 62607-4-2*DIN SPEC 42607-4-2Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) |
64263 |
DIN IEC/TS 62607-4-3*DIN SPEC 42607-4-3Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) |
64264 |
DIN IEC/TS 62607-4-4*DIN SPEC 42607-4-4Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) |
64265 |
DIN IEC/TS 62607-4-5*DIN SPEC 42607-4-5Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) |
64266 |
DIN IEC/TS 62607-4-7*DIN SPEC 42607-4-7Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English |
64267 |
DIN IEC/TS 62607-5-1*DIN SPEC 42607-5-1Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) |
64268 |
DIN IEC/TS 62607-6-4*DIN SPEC 42607-6-4Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) |
64269 |
DIN IEC/TS 62622*DIN SPEC 42622Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings (IEC/TS 62622:2012) Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings (IEC/TS 62622:2012) |
64270 |
DIN IEC/TS 62627-09*DIN SPEC 42627-09Fibre optic interconnecting devices and passive components - Terminology of passive optical devices (IEC 86B/3993/DTS:2016) Fibre optic interconnecting devices and passive components - Terminology of passive optical devices (IEC 86B/3993/DTS:2016) |
64271 |
DIN IEC/TS 62647-1*DIN SPEC 42647-1Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 1: Preparation for a lead-free control plan (IEC/TS 62647-1:2012) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 1: Preparation for a lead-free control plan (IEC/TS 62647-1:2012) |
64272 |
DIN IEC/TS 62647-2*DIN SPEC 42647-2Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 2: Mitigation of deleterious effects of tin (IEC/TS 62647-2:2012) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 2: Mitigation of deleterious effects of tin (IEC/TS 62647-2:2012) |
64273 |
DIN IEC/TS 62647-23*DIN SPEC 42647-23Process management for avionics - Aerospace and defence electronic systems containing lead free solder - Part 23: Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies (IEC 107/206/DTS:2013) Process management for avionics - Aerospace and defence electronic systems containing lead free solder - Part 23: Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies (IEC 107/206/DTS:2013) |
64274 |
DIN IEC/TS 62647-3*DIN SPEC 42647-3Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 3: Performance testing for systems containing lead-free solder and finishes (IEC 107/213/DTS:2013) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 3: Performance testing for systems containing lead-free solder and finishes (IEC 107/213/DTS:2013) |
64275 |
DIN IEC/TS 62661-2-1*DIN SPEC 42661-2-1Optical backplanes - Product specification - Part 2-1: Optical backplane using optical fibre circuit boards and multi-core right angle optical connectors (IEC 86/375/CD:2010) Optical backplanes - Product specification - Part 2-1: Optical backplane using optical fibre circuit boards and multi-core right angle optical connectors (IEC 86/375/CD:2010) |
64276 |
DIN IEC/TS 62668-1*DIN SPEC 42668-1Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components (IEC/TS 62668-1:2012) Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components (IEC/TS 62668-1:2012) |
64277 |
DIN IEC/TS 62720*DIN SPEC 42720Identification of units of measurement for computer-based processing (IEC/TS 62720:2017) Identification of units of measurement for computer-based processing (IEC/TS 62720:2017) |
64278 |
DIN IEC/TS 62727*VDE V 0126-60Photovoltaic systems - Specifications for solar trackers (IEC/TS 62727:2012) Photovoltaic systems - Specifications for solar trackers (IEC/TS 62727:2012) |
64279 |
DIN IEC/TS 62743*VDE V 0492-4-1Radiation protection instrumentation - Electronic counting dosemeters for pulsed fields of ionizing radiation (IEC/TS 62743:2012) Radiation protection instrumentation - Electronic counting dosemeters for pulsed fields of ionizing radiation (IEC/TS 62743:2012) |
64280 |
DIN IEC/TS 62782*VDE V 0126-46Photovoltaic (PV) modules - Cyclic (dynamic) mechanical load testing (IEC/TS 62782:2016) Photovoltaic (PV) modules - Cyclic (dynamic) mechanical load testing (IEC/TS 62782:2016) |