Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 1241 kết quả.
Searching result
| 861 |
DIN IEC/TS 61994-4-4*DIN SPEC 41994-4-4Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices (IEC/TS 61994-4-4:2010) Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices (IEC/TS 61994-4-4:2010) |
| 862 |
DIN IEC/TS 62056-1-1*DIN SPEC 42056-1-1Electricity metering data exchange - The DLMS/COSEM SUITE - Part 1-1: Template for DLMS/COSEM communication profile standards (IEC 13/1643A/DTS:2015) Electricity metering data exchange - The DLMS/COSEM SUITE - Part 1-1: Template for DLMS/COSEM communication profile standards (IEC 13/1643A/DTS:2015) |
| 863 |
DIN IEC/TS 62056-6-9*DIN SPEC 42056-6-9Electricity metering data exchange - Part 6-9: Mapping between the Common Information Model message profiles (IEC 61968-9) and DLMS/COSEM (IEC 62056) data models and protocols (IEC 13/1602/CD:2015) Electricity metering data exchange - Part 6-9: Mapping between the Common Information Model message profiles (IEC 61968-9) and DLMS/COSEM (IEC 62056) data models and protocols (IEC 13/1602/CD:2015) |
| 864 |
DIN IEC/TS 62056-9-1*DIN SPEC 42056-9-1Electricity metering data exchange - THE DLMS/COSEM SUITE - Part 9-1: Communication Profile using web-services to access a DLMS/COSEM Server via a COSEM Access Service (CAS) (IEC 13/1582A/CD:2014) Electricity metering data exchange - THE DLMS/COSEM SUITE - Part 9-1: Communication Profile using web-services to access a DLMS/COSEM Server via a COSEM Access Service (CAS) (IEC 13/1582A/CD:2014) |
| 865 |
DIN IEC/TS 62326-16*DIN SPEC 42326-16Printed boards - Part 16: Device Embedded Substrate Technology - Generics (IEC 91/1081/CD:2013) Printed boards - Part 16: Device Embedded Substrate Technology - Generics (IEC 91/1081/CD:2013) |
| 866 |
DIN IEC/TS 62326-17*DIN SPEC 42326-17Printed boards - Part 17: Device embedded substrates - TEG (test element group) (IEC 91/1082/CD:2013) Printed boards - Part 17: Device embedded substrates - TEG (test element group) (IEC 91/1082/CD:2013) |
| 867 |
DIN IEC/TS 62326-19*DIN SPEC 42326-19Printed boards - Part 19: Device Embedded Substrate - Design Guide (IEC 91/1084/CD:2013) Printed boards - Part 19: Device Embedded Substrate - Design Guide (IEC 91/1084/CD:2013) |
| 868 |
DIN IEC/TS 62370*DIN SPEC 35821Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures (IEC/TS 62370:2004 + Amd.1:2017) Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures (IEC/TS 62370:2004 + Amd.1:2017) |
| 869 |
DIN IEC/TS 62564-1*DIN SPEC 42664-1Process management for avionics - Aerospace qualified electronic component (AQEC) - Part 1: Integrated circuits and discrete semiconductors (IEC/TS 62564-1:2011) Process management for avionics - Aerospace qualified electronic component (AQEC) - Part 1: Integrated circuits and discrete semiconductors (IEC/TS 62564-1:2011) |
| 870 |
DIN IEC/TS 62579*DIN SPEC 44579Multimedia home server systems - Conceptual model for domain management (IEC/TS 62579:2010) Multimedia home server systems - Conceptual model for domain management (IEC/TS 62579:2010) |
| 871 |
DIN IEC/TS 62607-2-1*DIN SPEC 42607-2-1Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance (IEC/TS 62607-2-1:2012) Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance (IEC/TS 62607-2-1:2012) |
| 872 |
DIN IEC/TS 62607-3-2*DIN SPEC 42607-3-2Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion (IEC/TS 62607-3-2:2017) Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion (IEC/TS 62607-3-2:2017) |
| 873 |
DIN IEC/TS 62607-4-1*DIN SPEC 42607-4-1Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) |
| 874 |
DIN IEC/TS 62607-4-2*DIN SPEC 42607-4-2Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) |
| 875 |
DIN IEC/TS 62607-4-3*DIN SPEC 42607-4-3Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) |
| 876 |
DIN IEC/TS 62607-4-4*DIN SPEC 42607-4-4Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) |
| 877 |
DIN IEC/TS 62607-4-5*DIN SPEC 42607-4-5Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) |
| 878 |
DIN IEC/TS 62607-4-7*DIN SPEC 42607-4-7Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English |
| 879 |
DIN IEC/TS 62607-5-1*DIN SPEC 42607-5-1Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) |
| 880 |
DIN IEC/TS 62607-6-4*DIN SPEC 42607-6-4Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) |
