Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 1368 kết quả.
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881 |
IEC 60702-2:2002
Mineral insulated cables and their terminations with a rated voltage not exceeding 750 V - Part 2: Terminations |
882 |
IEC 60745-2-21:2002
Hand-held motor-operated electric tools - Safety - Part 2-21: Particular requirements for drain cleaners |
883 |
IEC 60745-2-4:2002
Hand-held motor-operated electric tools - Safety - Part 2-4: Particular requirements for sanders and polishers other than disk type |
884 |
IEC 60746-3:2002
Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity |
885 |
IEC 60747-16-3:2002
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters |
886 |
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887 |
IEC 60748-23-1:2002
Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification |
888 |
IEC 60748-23-2:2002
Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests |
889 |
IEC 60748-23-3:2002
Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report |
890 |
IEC 60748-23-4:2002
Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification |
891 |
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892 |
IEC 60749-10:2002
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
893 |
IEC 60749-11:2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
894 |
IEC 60749-2:2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure |
895 |
IEC 60749-22:2002
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength |
896 |
IEC 60749-31:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) |
897 |
IEC 60749-32:2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) |
898 |
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899 |
IEC 60761-1:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements |
900 |
IEC 60761-2:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols |