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881

IEC 60702-2:2002

Mineral insulated cables and their terminations with a rated voltage not exceeding 750 V - Part 2: Terminations

882

IEC 60745-2-21:2002

Hand-held motor-operated electric tools - Safety - Part 2-21: Particular requirements for drain cleaners

883

IEC 60745-2-4:2002

Hand-held motor-operated electric tools - Safety - Part 2-4: Particular requirements for sanders and polishers other than disk type

884

IEC 60746-3:2002

Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity

885

IEC 60747-16-3:2002

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

886

IEC 60748-1:2002

Semiconductor devices - Integrated circuits - Part 1: General

887

IEC 60748-23-1:2002

Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

888

IEC 60748-23-2:2002

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

889

IEC 60748-23-3:2002

Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

890

IEC 60748-23-4:2002

Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification

891

IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

892

IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

893

IEC 60749-11:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

894

IEC 60749-2:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

895

IEC 60749-22:2002

Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

896

IEC 60749-31:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

897

IEC 60749-32:2002

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

898

IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

899

IEC 60761-1:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements

900

IEC 60761-2:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols

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