Tra cứu Tiêu chuẩn quốc tế
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1021 |
IEC 60357:2002/AMD2:2008
Amendment 2 - Tungsten halogen lamps (non-vehicle) - Performance specifications |
1022 |
IEC 60364-4-43:2008
Low-voltage electrical installations - Part 4-43: Protection for safety - Protection against overcurrent |
1023 |
IEC 60384-11-1:2008
Fixed capacitors for use in electronic equipment - Part 11-1: Blank detail specification - Fixed polyethylene terephthalate film dielectric metal foil d.c. capacitors - Assessment level EZ |
1024 |
IEC 60384-11:2008
Fixed capacitors for use in electronic equipment - Part 11: Sectional specification - Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors |
1025 |
IEC 60384-20-1:2008
Fixed capacitors for use in electronic equipment - Part 20-1: Blank detail specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors - Assessment level EZ |
1026 |
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1027 |
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1028 |
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1029 |
IEC 60404-2:1996/AMD1:2008
Amendment 1 - Magnetic materials - Part 2: Methods of measurement of magnetic properties of electrical steel strip and sheet by means of an Epstein frame |
1030 |
IEC 60404-2:1996+AMD1:2008 CSV
Magnetic materials - Part 2: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of an Epstein frame |
1031 |
IEC 60404-4:1995/AMD2:2008
Amendment 2 - Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials |
1032 |
IEC 60404-4:1995+AMD1:2000+AMD2:2008 CSV
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials |
1033 |
IEC 60512-15-1:2008
Connectors for electronic equipment - Tests and measurements - Part 15-1: Connector tests (mechanical) - Test 15a: Contact retention in insert |
1034 |
IEC 60512-15-3:2008
Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional) |
1035 |
IEC 60512-15-4:2008
Connectors for electronic equipment - Tests and measurements - Part 15-4: Connector tests (mechanical) - Test 15d: Contact insertion, release and extraction force |
1036 |
IEC 60512-15-5:2008
Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation |
1037 |
IEC 60512-15-6:2008
Connectors for electronic equipment - Tests and measurements - Part 15-6: Connector tests (mechanical) - Test 15f: Effectiveness of connector coupling devices |
1038 |
IEC 60512-15-7:2008
Connectors for electronic equipment - Tests and measurements - Part 15-7: Connector tests (mechanical) - Test 15g: Robustness of protective cover attachment |
1039 |
IEC 60512-16-1:2008
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage |
1040 |
IEC 60512-16-11:2008
Connectors for electronic equipment - Tests and measurements - Part 16-11: Mechanical tests on contacts and terminations - Test 16k: Stripping force, solderless wrapped connections |