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| 17821 |
BS PD IEC TS 62312-1-1-TC:2020Tracked Changes (Redline) - Guideline for synchronization of audio and video Part 1-1: Measurement methods for synchronization of audio and video equipment and systems — General Tracked Changes (Redline) - Guideline for synchronization of audio and video Part 1-1: Measurement methods for synchronization of audio and video equipment and systems — General |
| 17822 |
BS PD IEC TS 62312-2-TC:2020Tracked Changes (Redline) - Guideline for synchronization of audio and video Part 2: Methods for synchronization of audio and video systems Tracked Changes (Redline) - Guideline for synchronization of audio and video Part 2: Methods for synchronization of audio and video systems |
| 17823 |
BS PD IEC TS 62351-100-3:2020Power systems management and associated information exchange - Data and communications security Part 100-3: Conformance test cases for the IEC 62351-3, the secure communication extension for profiles including TCP/IP Power systems management and associated information exchange - Data and communications security Part 100-3: Conformance test cases for the IEC 62351-3, the secure communication extension for profiles including TCP/IP |
| 17824 |
BS PD IEC TS 62600-1:2020Marine energy - Wave, tidal and other water current converters Part 1: Vocabulary Marine energy - Wave, tidal and other water current converters Part 1: Vocabulary |
| 17825 |
BS PD IEC TS 62600-3:2020Marine energy — Wave, tidal and other water current converters Part 3: Measurement of mechanical loads Marine energy — Wave, tidal and other water current converters Part 3: Measurement of mechanical loads |
| 17826 |
BS PD IEC TS 62600-4:2020Marine energy – Wave, tidal and other water current converters Part 4: Specification for establishing qualification of new technology Marine energy – Wave, tidal and other water current converters Part 4: Specification for establishing qualification of new technology |
| 17827 |
BS PD IEC TS 62607-2-4:2020Nanomanufacturing - Key control characteristics Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes Nanomanufacturing - Key control characteristics Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes |
| 17828 |
BS PD IEC TS 62607-3-3:2020Nanomanufacturing - Key control characteristics Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC) Nanomanufacturing - Key control characteristics Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC) |
| 17829 |
BS PD IEC TS 62607-4-8:2020Nanomanufacturing - Key control characteristics Part 4-8: Nano-enabled electrical energy storage - Determination of water content in electrode nanomaterials, Karl Fischer method Nanomanufacturing - Key control characteristics Part 4-8: Nano-enabled electrical energy storage - Determination of water content in electrode nanomaterials, Karl Fischer method |
| 17830 |
BS PD IEC TS 62607-5-3:2020Nanomanufacturing - Key control characteristics Part 5-3: Thin-film organic/nano electronic devices - Measurements of charge carrier concentration Nanomanufacturing - Key control characteristics Part 5-3: Thin-film organic/nano electronic devices - Measurements of charge carrier concentration |
| 17831 |
BS PD IEC TS 62607-6-1:2020Nanomanufacturing — Key control characteristics Part 6-1: Graphene-based material — Volume resistivity: four probe method Nanomanufacturing — Key control characteristics Part 6-1: Graphene-based material — Volume resistivity: four probe method |
| 17832 |
BS PD IEC TS 62607-6-13:2020Nanomanufacturing — Key control characteristic Part 6-13: Graphene-based material — Oxygen functional group content: Boehm titration method Nanomanufacturing — Key control characteristic Part 6-13: Graphene-based material — Oxygen functional group content: Boehm titration method |
| 17833 |
BS PD IEC TS 62607-6-3:2020Nanomanufacturing — Key control characteristics Part 6-3: Graphene-based material — Domain size: substrate oxidation Nanomanufacturing — Key control characteristics Part 6-3: Graphene-based material — Domain size: substrate oxidation |
| 17834 |
BS PD IEC TS 62607-8-1:2020Nanomanufacturing — Key control characteristics Part 8-1: Nano-enabled metal-oxide interfacial devices — Test method for defect states by thermally stimulated current Nanomanufacturing — Key control characteristics Part 8-1: Nano-enabled metal-oxide interfacial devices — Test method for defect states by thermally stimulated current |
| 17835 |
BS PD IEC TS 62686-1:2020Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
| 17836 |
BS PD IEC TS 62686-2-TC:2020Tracked Changes (Redline) – Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 2: General requirements for passive components Tracked Changes (Redline) – Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 2: General requirements for passive components |
| 17837 |
BS PD IEC TS 62749:2020Assessment of power quality — Characteristics of electricity supplied by public networks Assessment of power quality — Characteristics of electricity supplied by public networks |
| 17838 |
BS PD IEC TS 62788-5-2:2020Measurement procedures for materials used in photovoltaic modules Part 5-2: Edge seals - Durability evaluation guideline Measurement procedures for materials used in photovoltaic modules Part 5-2: Edge seals - Durability evaluation guideline |
| 17839 |
BS PD IEC TS 62804-1-1:2020Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation Part 1-1: Crystalline silicon – Delamination Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation Part 1-1: Crystalline silicon – Delamination |
| 17840 |
BS PD IEC TS 62836:2020Measurement of internal electric field in insulating materials - Pressure wave propagation method Measurement of internal electric field in insulating materials - Pressure wave propagation method |
