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| 18821 |
IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers |
| 18822 |
IEC 60747-16-3:2002/AMD2:2017
Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters |
| 18823 |
IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters |
| 18824 |
IEC 60747-16-4:2004/AMD2:2017
Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches |
| 18825 |
IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches |
| 18826 |
IEC 60747-4:2007/AMD1:2017
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors |
| 18827 |
IEC 60747-4:2007+AMD1:2017 CSV
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors |
| 18828 |
IEC 60749-12:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
| 18829 |
IEC 60749-28:2017
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level |
| 18830 |
IEC 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
| 18831 |
IEC 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) |
| 18832 |
IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans |
| 18833 |
IEC 60749-5:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| 18834 |
IEC 60749-6:2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
| 18835 |
IEC 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking |
| 18836 |
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| 18837 |
IEC 60793-1-1:2017
Optical fibres - Part 1-1: Measurement methods and test procedures - General and guidance |
| 18838 |
IEC 60793-1-1:2017 RLV
Optical fibres - Part 1-1: Measurement methods and test procedures - General and guidance |
| 18839 |
IEC 60793-1-33:2017
Optical fibres - Part 1-33: Measurement methods and test procedures - Stress corrosion susceptibility |
| 18840 |
IEC 60793-1-45:2017
Optical fibres - Part 1-45: Measurement methods and test procedures - Mode field diameter |
