Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 104041 kết quả.
Searching result
| 5221 |
BS IEC 62047-42:2022Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever. Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever. |
| 5222 |
BS IEC 62125:2019Environmental considerations specific to insulated electrical power and control cables. Environmental considerations specific to insulated electrical power and control cables. |
| 5223 |
BS IEC 62125:2019-TCTracked Changes. Environmental considerations specific to insulated electrical power and control cables. Tracked Changes. Environmental considerations specific to insulated electrical power and control cables. |
| 5224 |
BS IEC 62397:2022-TCTracked Changes. Nuclear power plants. Instrumentation and control important to safety. Resistance temperature detectors. Tracked Changes. Nuclear power plants. Instrumentation and control important to safety. Resistance temperature detectors. |
| 5225 |
BS IEC 62783-1-1:2022Twinax cables for digital communications. Time domain test methods for twinax cables for digital communications. General requirements. Twinax cables for digital communications. Time domain test methods for twinax cables for digital communications. General requirements. |
| 5226 |
BS IEC 62862-3-1:2022Solar thermal electric plants. Systems and components. General requirements for the design of parabolic-trough solar thermal power plants. Solar thermal electric plants. Systems and components. General requirements for the design of parabolic-trough solar thermal power plants. |
| 5227 |
BS IEC 62862-4-1:2022Solar thermal electric plants. General requirements for the design of solar power tower plants. Solar thermal electric plants. General requirements for the design of solar power tower plants. |
| 5228 |
BS IEC 62862-5-2:2022Solar thermal electric plants. Systems and components. General requirements and test methods for large-size linear Fresnel collectors. Solar thermal electric plants. Systems and components. General requirements and test methods for large-size linear Fresnel collectors. |
| 5229 |
BS IEC 62899-201-2:2021Printed electronics. Materials. Substrates. Measurement methods for properties of stretchable substrates. Printed electronics. Materials. Substrates. Measurement methods for properties of stretchable substrates. |
| 5230 |
BS IEC 62906-5-5:2022Laser displays. Optical measuring methods of raster-scanning retina direct projection laser displays. Laser displays. Optical measuring methods of raster-scanning retina direct projection laser displays. |
| 5231 |
BS IEC 62906-5-7:2022Laser displays. Measuring methods of image quality affected by speckle for scanning laser displays. Laser displays. Measuring methods of image quality affected by speckle for scanning laser displays. |
| 5232 |
BS IEC 62951-9:2022Semiconductor devices. Flexible and stretchable semiconductor devices. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells. Semiconductor devices. Flexible and stretchable semiconductor devices. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells. |
| 5233 |
BS IEC 63068-4:2022Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence. |
| 5234 |
|
| 5235 |
BS IEC 63145-21-20:2022Eyewear display. Specific measurement methods for VR image quality. Screen door effect. Eyewear display. Specific measurement methods for VR image quality. Screen door effect. |
| 5236 |
BS IEC 63171-4:2022Connectors for electrical and electronic equipment. Detail specification for shielded or unshielded, free and fixed connectors with up to 8 ways for balanced single-pair data transmission with current carrying capacity. Mechanical mating information, pin assignment and additional requirements for Type 4. Connectors for electrical and electronic equipment. Detail specification for shielded or unshielded, free and fixed connectors with up to 8 ways for balanced single-pair data transmission with current carrying capacity. Mechanical mating information, pin assignment and additional requirements for Type 4. |
| 5237 |
BS IEC 63275-1:2022Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability. |
| 5238 |
BS IEC SRD 63188:2022Smart cities reference architecture methodology. Smart cities reference architecture methodology. |
| 5239 |
BS IEC SRD 63233-1:2022Smart city standards inventory and mapping. Methodology. Smart city standards inventory and mapping. Methodology. |
| 5240 |
BS IEC/IEEE 62582-2:2022-TCTracked Changes. Nuclear power plants. Instrumentation and control important to safety. Electrical equipment condition monitoring methods. Indenter measurements. Tracked Changes. Nuclear power plants. Instrumentation and control important to safety. Electrical equipment condition monitoring methods. Indenter measurements. |
